A Reversible LFSR Pseudo-Random Sequences Generator
نویسنده
چکیده
With the development of science and technology, many testable design methods have been widely studied and applied to improve the quality of IC testing and reduce cost. Built-in self-test (BIST) is a primary self-test methodology and is widely used for testing VLSI circuits. This method configures circuits for testing itself, with the advantage of low test complexity, short test time, high fault coverage rate and so on. It will be a very important direction for future research. It includes test-pattern generators and output response analyzer. To test-pattern generators, Linear Feedback Shift Registers (LFSRs) becomes the mainstream, mainly due to its simple structure and high sequence coverage rate[1].
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